• head_banner_01

AQG324 Power Fabrica Certification

Description:

ECPE Societas laborantis AQG 324 mense Iunio 2017 constituta laborat in Qualificatione Europaeae Guideline pro Power Modulae pro Usus in Power Electronics Converter Unitates in Vehiculis motoriis.


Product Detail

Product Tags

Service Introductio

ECPE Societas laborantis AQG 324 mense Iunio 2017 constituta laborat in Qualificatione Europaeae Guideline pro Power Modulae pro Usus in Power Electronics Converter Unitates in Vehiculis motoriis.

Ex priori Germano LV 324 (´Qualification of Power Electronics Modules for Use in Motor Vehicle Components - Requirements General, Test Conditions and Tests´) the ECPE Guideline definit ratio communis ad moduli probandi indolem ac pro environmental et vita probationis. potentia electronic modulorum ad applicationem autocineticam.

Ratio dimissa est ab responsabili Societas Industrialis Working EcPE complectens societates membrum cum plus quam 30 industria repraesentantium ex catena copia autocineta.

Praesens AQG 324 versio data 12 Aprilis 2018 tendit in modulorum potentiae Si-fundatae ubi futurae versiones liberandae a Group Working etiam operient novas bandgap latae potentiae semiconductores SiC et GaN.

Per AQG324 penitus interpretando et signa ab expertis quadrigis relata, GRGT facultates technicas potentiae moduli verificationis stabilivit, cum auctoritativa AQG324 inspectionem et verificationem tradit ad up- declive conatum in potentia semiconductoris industriae.

Service Scope

Potestas fabrica modulorum et equivalentis speciali consilio products secundum discretos cogitationes

Test signa

DINENISO/IEC17025 Requirements generales pro competentia probationis et calibrationis Laboratorium

● IEC 60747:Semiconductor machinae, Discretae machinae

● IEC 60749:Semiconductor machinae Mechanicae et Climaticae Test Methodi

DIN EN 60664:Insulation Coordinatio pro Equipment Within Low-Voltage Systems

DIEN60069: Environmental Testis

JESD22-A119:2009: Minimum Temperature at Life

Test items

Genus test

Test items

OMNIBUS deprehendatur

Parametri static, parametri dynamici, nexus tabulatorum detectio (SAM), IPI/VI, OMA

Modulus propria test

Inductionem errantium Parasiticarum, scelerisque resistentia, ambitus breves resistendi, Nulla probatio, detectio parametri mechanica

Test Environmental

Offensus scelerisque, vibratio mechanica, concussa mechanica

Vita test

Potentia cyclica (PCsec, PCmin), HTRB, HV-H3TRB, dynamica porta dynamica, dynamica inclinatio transversa, dynamica H3TRB, corporis diodi bipolaris degradatio.


  • Priora:
  • Deinde:

  • Epistulam tuam hic scribe et mitte nobis